ANALYSIS OF SILAR- DEPOSITED CuSFe THIN FILMS FOR OPTOELECTRONICS APPLICATION. The Journals of the Nigerian Association of Mathematical Physics, [S. l.], v. 66, p. 73–78, 2024. DOI: 10.60787/jnamp-v66-310. Disponível em: https://nampjournals.org.ng/index.php/home/article/view/310.. Acesso em: 6 jul. 2024.